ARPES/Spin ARPES
Angle-Resolved Photoelectron Spectroscopy (ARPES) detects the energy and angle distribution of photoelectrons to determine the electronic structure of solids. Spin-Resolved Photoelectron Spectroscopy is the key to characterise magnetic properties of surfaces and correlate them to the electronic structure.
These techniques demands ultimate energy and resolution. It is necessary to have optimized geometries, lowest magnetic fields, special manipulators for ultralow sample temperatures, special UV or laser sources. Usually, a preparation chamber is needed for sample preparation and surface quality control by LEED. Finally, best pressures are needed to keep the sample surfaces clean.
ARPES
The SPECS system for laboratory ARPES is a fully equipped UHV analysis sytem for modern surface analysis including ARPES and XPS. The system comes with the PHOIBOS analyzer series in combination with a ultra low temperature manipulator, sophisticated sample handling and a monochromated small spot UV and X-ray source.
The analysis module is based on a special µ-metal chamber optimized for low kinetic energy analysis. A dedicated surface science preparation module with all necessary techniques (surface cleaning, LEED, deposition, sample storage) is included as well as a fast entry loadlock.
SPECS Astraois 190
Modern analyzers and surface analysis systems offer the possibility to access a second emission angle by tilting the sample along the y-axis or by using an integrated mapping deflector inside the electron lens (for example the SPECS ASTRAIOS 190). By shifting the emission angle in the second dimension, it is possible to acquire a two dimensional band map in the dimensions kx and ky. The out-of-plane momentum kz, can be accessed by changing the photon energy of the excitation light source.
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